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Lista de artículos
Publicación |
L. Donetti, C. Sampedro Matarín, F.J. García Ruiz, A. Godoy Medina
and
F.J. Gamiz Perez,
"Multi-Subband Ensemble Monte Carlo simulations of scaled GAA MOSFETs", "Solid-State Electronics"
, vol.143, 49-55, 2018
|
J.L. Padilla De La Torre "Analysis of the Heterogate Electron-Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities", "IEEE Transactions on Electron Devices"
, vol.65, 339-346, 2018
|
J.L. Padilla De La Torre, C. Medina Bailón, C. Márquez González, C. Sampedro Matarín, L. Donetti, F.J. Gamiz Perez
and
A.M. Ionescu,
"Gate Leakage Tunneling Impact on the InAs/GaSb Heterojunction Electron-Hole Bilayer Tunneling Field-Effect Transistor", "IEEE Transactions on Electron Devices"
, vol.65, 4679-4686, 2018
|
C. Navarro Moral, L. Donetti
and
C. Márquez González,
" InGaAs Capacitor-Less DRAM Cells TCAD Demonstration", "IEEE Journal of the Electron Devices Society"
, vol.6, 884-892, 2018
|
J.L. Padilla De La Torre, C. Medina Bailón, C. Navarro Moral, C. Alper, F.J. Gamiz Perez
and
A. Ionescu,
"Analysis of the Heterogate Electron¿Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities", "IEEE Transactions on Electron Devices"
, vol.65, 339-346, 2018
|
C. Medina Bailón, J.L. Padilla De La Torre, C. Sampedro Matarín, A. Godoy Medina, L. Donetti
and
F.J. Gamiz Perez,
"Source-to-Drain Tunneling Analysis in FDSOI, DGSOI, and FinFET Devices by Means of Multisubband Ensemble Monte Carlo", "IEEE Transactions on Electron Devices"
, vol.65, 4740-4746, 2018
|
C. Márquez González "Experimental characterization of the random telegraph noise signature in MOSFETs under the Influence of Magnetic Fields", "IEEE Electron Device Letters"
, vol.39, 1054-1057, 2018
|
C. Navarro Moral, S. Barraud, S. Martinie, J. Lacord, M. Jaud
and
M. Vinet,
"Reconfigurable field effect transistor for advanced CMOS: Advantages and limitations", "Solid-State Electronics"
, vol.128, 155-612, 2017
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Última actualización del SICA: 10/01/2024