GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
(Ref. TIC-216)
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Scientific production
BACK TO LISTArticle details
| Publication | |
|---|---|
| Title: | EXPERIMENTAL CHARACTERIZATION OF THE RANDOM TELEGRAPH NOISE SIGNATURE IN MOSFETS UNDER THE INFLUENCE OF MAGNETIC FIELDS |
| Journal title: | IEEE ELECTRON DEVICE LETTERS |
| Contribution type: | ARTICULO |
| Journal number: | 7 |
| Volume number: | 39 |
| Number of pages of the publication: | 1054 - 1057 |
| Publication year: | 2018 |
| Authors: |
CARLOS MÁRQUEZ GONZÁLEZ |
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