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Publicación |
C. Navarro Moral, C. Márquez González, S. Navarro Moral, C. Lozano, S. Kwon, Y. Kim
and
F.J. Gamiz Perez,
"Simulation Perspectives of Sub-1V Single-Supply Z2-FET 1T-DRAM Cells for Low-Power", "IEEE Access"
, vol.7, 40279-40284, 2019
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C. Medina Bailón, J.L. Padilla De La Torre, T. Sadi, C. Sampedro Matarín, A. Godoy Medina, L. Donetti, V.P. Georgiev, F.J. Gamiz Perez
and
A. Asenov,
"Multisubband Ensemble Monte Carlo Analysis of Tunneling Leakage Mechanisms in Ultrascaled FDSOI, DGSOI, and FinFET Devices", "IEEE Transactions on Electron Devices"
, vol.66, 1145-1152, 2019
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C. Navarro Moral
and
C. Márquez González,
"3-D TCAD Study of the implications of channel width and interface states on FD-SOI Z2-FETs", "IEEE Transactions on Electron Devices"
, vol.66, 2513-2519, 2019
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S. Kwon, C. Navarro Moral, F.J. Gamiz Perez, S. Cristoloveanu , P. Galy, M. Choi, Y. Kim
and
J. Ahn,
"Characteristics of band modulation FET on sub 10 nm SOI", "Japanese Journal of Applied Physics"
, vol.58, SBBB07-, 2019
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M. Duan, C. Navarro Moral, B. Cheng, F. Adamu-Lema, X. Wang, V. Georgiev, F.J. Gamiz Perez, C. Millar
and
A. Asenov,
"Thorough Understanding of Retention Time of Z2-FET Memory Operation", "IEEE Transactions on Electron Devices"
, vol.66, 383-388, 2019
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C. Márquez González, C. Navarro Moral, S. Navarro, J.L. Padilla De La Torre, L. Donetti, C. Sampedro Matarín, P. Gally, Y. Kim
and
F.J. Gamiz Perez,
"On the Low-Frequency Noise Characterization of Z2-FET Devices", "IEEE Access"
, vol.7, 42551-42556, 2019
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J.L. Padilla De La Torre, C. Medina Bailón, C. Navarro Moral, C. Alper, F.J. Gamiz Perez
and
A. Ionescu,
"Analysis of the Heterogate Electron¿Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities", "IEEE Transactions on Electron Devices"
, vol.65, 339-346, 2018
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L. Donetti, C. Sampedro Matarín, F.J. García Ruiz, A. Godoy Medina
and
F.J. Gamiz Perez,
"Multi-Subband Ensemble Monte Carlo simulations of scaled GAA MOSFETs", "Solid-State Electronics"
, vol.143, 49-55, 2018
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Última actualización del SICA: 10/01/2024