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J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva, P. Cartujo-Estebanez, P. Cartujo-Cassinello and J.E. Carceller Beltran,  "A MODEL FOR THE DRAIN CURRENT OF DEEP SUBMICROMETER MOSFET'S INCLUDING ELECTRON-VELOCITY OVERSHOOT",  IEEE Transactions on Electron Devices, vol.45 , 2249-2251, 1998
J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva, P. Cartujo Cassinello, P. Cartujo Estebanez and J.E. Carceller Beltran,  "A MODEL FOR THE DRAIN CURRENT OF DEEP SUBMICROMETER MOSFET'S INCLUDING ELECTRON-VELOCITY OVERSHOOT",  IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.45 , 2249-2251, 1998
J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva and J.E. Carceller Beltran,  "AN ANALYTICAL MODEL FOR THE ELECTRON VELOCITY OVERSHOOT EFFECTS IN STRAINED-SI ON SIXGE1-X MOSFET'S",  IEEE Transactions on Electron Devices, vol.45 , 993-995, 1998
J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva and J.E. Carceller Beltran,  "AN ANALYTICAL MODEL FOR THE ELECTRON VELOCITY OVERSHOOT EFFECTS IN STRAINED-SI ON SIXGE1-X MOSFET'S",  IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.45 , 993-995, 1998
J.B. Roldan Aranda, F.J. Gamiz Perez and J.A. Lopez Villanueva,  "DEVELOPMENT OF A METHOD FOR DETERMINING THE DEPENDENCE OF THE ELECTRON MOBILITY ON THE LONGITUDINAL-ELECTRIC FIELD IN MOSFETS ",  VLSI DESIGN , vol.8 , 261-264, 1998
J.B. Roldan Aranda, F.J. Gamiz Perez and J.A. Lopez Villanueva,  "DEVELOPMENT OF A METHOD FOR DETERMINING THE DEPENDENCE OF THE ELECTRON MOBILITY ON THE LONGITUDINAL-ELECTRIC FIELD IN MOSFETS",  VLSI Design, vol.8 , 261-264, 1998
F.J. Gamiz Perez, J.B. Roldan Aranda, J.A. Lopez Villanueva, P. Cartujo-Estebanez and P. Cartujo-Cassinello,  "ELECTRON-MOBILITY IN QUANTIZED BETA-SIC INVERSION-LAYERS",  , vol.16 , 1631-1633, 1998
F.J. Gamiz Perez, J.B. Roldan Aranda, J.A. Lopez Villanueva, P. Cartujo Estebanez and P. Cartujo Cassinello,  "ELECTRON-MOBILITY IN QUANTIZED BETA-SIC INVERSION-LAYERS",  JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. PART B. MICROELECTRONICS AND NANOMETER STRUCTURES, vol.16 , 1631-1633, 1998
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