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Producción científica


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J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva, P. Cartujo Cassinello and P. Cartujo Estebanez,  "DEEP SUBMICROMETER SOI MOSFET DRAIN CURRENT MODEL INCLUDING SERIES RESISTANCE, SELF-HEATING AND VELOCITY OVERSHOOT EFFECTS",  IEEE ELECTRON DEVICE LETTERS , vol.21 , 239-241, 2000
J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva, P. Cartujo-Cassinello and P. Cartujo-Estebanez,  "DEEP SUBMICROMETER SOI MOSFET DRAIN CURRENT MODEL INCLUDING SERIES RESISTANCE, SELF-HEATING AND VELOCITY OVERSHOOT EFFECTS",  IEEE Electron Device Letters, vol.21 , 239-241, 2000
J.A. Lopez Villanueva, P. Cartujo-Cassinello, F.J. Gamiz Perez, J. Banqueri Ozaez and A.J. Palma Lopez,  "EFFECTS OF THE INVERSION-LAYER CENTROID ON THE PERFORMANCE OF DOUBLE-GATE MOSFET'S",  IEEE Transactions on Electron Devices, vol.47 , 141-146, 2000
J.A. Lopez Villanueva, P. Cartujo Cassinello, F.J. Gamiz Perez, J. Banqueri Ozaez and A.J. Palma Lopez,  "EFFECTS OF THE INVERSION-LAYER CENTROID ON THE PERFORMANCE OF DOUBLE-GATE MOSFET'S",  IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.47 , 141-146, 2000
S. Rodriguez Bolivar, F.J. Gamiz Perez, A.J. Palma Lopez, P. Cartujo Estebanez and J.E. Carceller Beltran,  "INFLUENCE OF TECHNOLOGICAL PARAMETERS ON THE BEHAVIOR OF THE HOLE EFFECTIVE MASS IN SIGE STRUCTURES",  Journal of Applied Physics, vol.88 , 1978-1982, 2000
S. Rodriguez Bolivar, F.J. Gamiz Perez, A.J. Palma Lopez, P. Cartujo Estebanez and J.E. Carceller Beltran,  "INFLUENCE OF TECHNOLOGICAL PARAMETERS ON THE BEHAVIOR OF THE HOLE EFFECTIVE MASS IN SIGE STRUCTURES",  JOURNAL OF APPLIED PHYSICS , vol.88 , 1978-1982, 2000
J.A. Lopez Villanueva, P. Cartujo Cassinello, F.J. Gamiz Perez, J. Banqueri Ozaez and A.J. Palma Lopez,  "COMPARISON OF CHARGE DISTRIBUTION IN DOUBLE-GATE AND SINGLE-GATE MOSFETS", "CONFERENCIA DE DISPOSITIVOS ELECTRÓNICOS (2.1999.MADRID)", 149-152, 1999
J.B. Roldan Aranda, F.J. Gamiz Perez, J.A. Lopez Villanueva, J.E. Carceller Beltran and P. Cartujo-Estebanez,  "IMPROVEMENT OF STRAINED SI ON SIGE DEEP SUBMICRON SHORT-CHANNEL MOBILITY USING A STEPPED DOPING PROFILE", "CONFERENCIA DE DISPOSITIVOS ELECTRÓNICOS (2.1999.MADRID)", 161-166, 1999
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