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21
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2024
noviembre 2024
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Producción científica


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Publicación
C. Medina Bailón, C. Sampedro Matarín, J.L. Padilla De La Torre, A. Godoy Medina, L. Donetti, F.J. Gamiz Perez and A. Asenov,  "MS-EMC vs. NEGF: A Comparative Study Accounting for Transport Quantum Corrections", "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon", None-None, 2018
C. Navarro Moral, S. Navarro-Moral, C. Márquez González, C. Sampedro Matarín, L. Donetti, S. Karg, H. Riel and F.J. Gamiz Perez,  "Towards InGaAs MSDRAM Capacitor-less Cells", "233rd Electrochemical Society Meeting", None-None, 2018
C. Navarro Moral, L. Donetti and C. Márquez González,  " InGaAs Capacitor-Less DRAM Cells TCAD Demonstration",  IEEE Journal of the Electron Devices Society, vol.6 , 884-892, 2018
J.L. Padilla De La Torre "Analysis of the Heterogate Electron-Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities",  IEEE Transactions on Electron Devices, vol.65 , 339-346, 2018
J.L. Padilla De La Torre, C. Medina Bailón, C. Navarro Moral, C. Alper, F.J. Gamiz Perez and A. Ionescu,  "Analysis of the Heterogate Electron¿Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities",  IEEE Transactions on Electron Devices, vol.65 , 339-346, 2018
C. Márquez González "Experimental characterization of the random telegraph noise signature in MOSFETs under the Influence of Magnetic Fields",  IEEE Electron Device Letters, vol.39 , 1054-1057, 2018
C. Navarro Moral and C. Márquez González,  "Experimental demonstration of Operational Z2-FET Memory Matrix",  IEEE Electron Device Letters, vol.39 , 660-663, 2018
J.L. Padilla De La Torre, C. Medina Bailón, C. Márquez González, C. Sampedro Matarín, L. Donetti, F.J. Gamiz Perez and A.M. Ionescu,  "Gate Leakage Tunneling Impact on the InAs/GaSb Heterojunction Electron-Hole Bilayer Tunneling Field-Effect Transistor",  IEEE Transactions on Electron Devices, vol.65 , 4679-4686, 2018

Última actualización del SICA: 10/01/2024

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