Producción científica
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C. Navarro Moral, C. Márquez González, S. Navarro Moral, C. Lozano, S. Kwon, Y. Kim
and
F.J. Gamiz Perez,
"Simulation Perspectives of Sub-1V Single-Supply Z2-FET 1T-DRAM Cells for Low-Power", IEEE Access, vol.7
, 40279-40284, 2019
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M. Duan, C. Navarro Moral, B. Cheng, F. Adamu-Lema, X. Wang, V. Georgiev, F.J. Gamiz Perez, C. Millar
and
A. Asenov,
"Thorough Understanding of Retention Time of Z2-FET Memory Operation", IEEE Transactions on Electron Devices, vol.66
, 383-388, 2019
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L. Donetti, C. Sampedro Matarín, F.J. García Ruiz, A. Godoy Medina
and
F.J. Gamiz Perez,
"3D multi-subband ensemble Monte Carlo simulation of <100> and <110> Si nanowire FETs", "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon", None-None, 2018
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C. Lozano-Pons, C. Tallon-Cuenca, C. Sampedro Matarín, F.J. Gamiz Perez, C. Márquez González
and
R.A. Casermeiro-Anta,
"DESARROLLO DE UN RADAR LIGERO DE BANDA ULTRAANCHA PARA DETECCIÓN DE OBSTÁCULOS Y PRESENCIA EN ENTORNOS SUBTERRÁNEOS", "III Congreso Internacional de Estudios Militares", None-None, 2018
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F.J. García Ruiz, E. González Marín, C.J. Martínez Blanque, I.M. Tienda-Luna, J.M. González, A. Toral López, A. Godoy Medina
and
L. Donetti,
"Hole mobility of cylindrical GaSb nanowires", "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon", None-None, 2018
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J.L. Padilla De La Torre, C. Medina Bailón, M. Rupakula, C. Alper, C. Sampedro Matarín, F.J. Gamiz Perez
and
A.M. Ionescu,
"Impact of electron effective mass variation on the performance of InAs/GaSb Electron-Hole Bilayer Tunneling Field-Effect Transistor", "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon", None-None, 2018
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C. Medina Bailón, C. Sampedro Matarín, J.L. Padilla De La Torre, A. Godoy Medina, L. Donetti, V. Georgiev, F.J. Gamiz Perez
and
A. Asenov,
"Impact of Strain on S/D tunneling in FinFETs: A MS-EMC Study", "23rd International Conference on Simulation of Semiconductor Processes and Devices", None-None, 2018
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C. Medina Bailón, T. Sadi, C. Sampedro Matarín, J.L. Padilla De La Torre, L. Donetti, V. Georgiev, F.J. Gamiz Perez
and
A. Asenov,
"Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator", "Conference on Numerical Methods and Applications", None-None, 2018
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