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J.A. Lopez Villanueva, I. Melchor Ferrer, F.J. Gamiz Perez, J. Banqueri Ozaez and J.A. Jimenez Tejada,  "A MODEL FOR THE QUANTIZED ACCUMULATION LAYER IN METAL-INSULATOR-SEMICONDUCTOR STRUCTURES",  Solid-State Electronics, vol.38 , 203-210, 1995
F.J. Gamiz Perez, J. Banqueri Ozaez, J.E. Carceller Beltran and J.A. Lopez Villanueva,  "EFFECTS OF BULK-IMPURITY AND INTERFACE-CHARGE ON THE ELECTRON-MOBILITY IN MOSFETS",  Solid-State Electronics, vol.38 , 611-614, 1995
F.J. Gamiz Perez, J. Banqueri Ozaez, J.E. Carceller Beltran and J.A. Lopez Villanueva,  "EFFECTS OF BULK-IMPURITY AND INTERFACE-CHARGE ON THE ELECTRON-MOBILITY IN MOSFETS",  SOLID STATE ELECTRONICS, vol.38 , 611-614, 1995
J.A. Lopez Villanueva, J.E. Carceller Beltran, F.J. Gamiz Perez and J. Banqueri Ozaez,  "ELECTRON TRAPPING AND DETRAPPING IN NEAR-INTERFACIAL TRAPS DURING FOWLER-NORDHEIM TUNNELING INJECTION AT 77 K",  Microelectronic Engineering, vol.28 , 317-320, 1995
J.A. Lopez Villanueva, J.E. Carceller Beltran, F.J. Gamiz Perez and J. Banqueri Ozaez,  "ELECTRON TRAPPING AND DETRAPPING IN NEAR-INTERFACIAL TRAPS DURING FOWLER-NORDHEIM TUNNELING INJECTION AT 77 K",  MICROELECTRONIC ENGINEERING , vol.28 , 317-320, 1995
F.J. Gamiz Perez, J.A. Lopez Villanueva, J. Banqueri Ozaez and J.E. Carceller Beltran,  "INFLUENCE OF THE OXIDE-CHARGE DISTRIBUTION PROFILE ON ELECTRON-MOBILITY IN MOSFETS",  IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.42 , 999-1004, 1995
F.J. Gamiz Perez, J.A. Lopez Villanueva, J. Banqueri Ozaez and J.E. Carceller Beltran,  "INFLUENCE OF THE OXIDE-CHARGE DISTRIBUTION PROFILE ON ELECTRON-MOBILITY IN MOSFETS",  IEEE Transactions on Electron Devices, vol.42 , 999-1004, 1995
F.J. Gamiz Perez, J.A. Lopez Villanueva, J. Banqueri Ozaez, Y. Ghailan- and J.E. Carceller Beltran,  "OXIDE CHARGE SPACE CORRELATION IN INVERSION-LAYERS .2. 3-DIMENSIONAL OXIDE CHARGE-DISTRIBUTION",  Semiconductor Science and Technology, vol.10 , 592-600, 1995
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