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F.J. Gamiz Perez, A. Godoy Medina
and
J.B. Roldan Aranda,
"A NEW REMOTE COULOMB SCATTERING MODEL FOR ULTRATHIN OXIDE MOSFETS", "INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PORCESSES AND DEVICES (.2003.CAMBRIDGE, MASSACHUSSETS, USA)", 235-238, 2003
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A. Godoy Medina
and
F.J. Gamiz Perez,
"COMPARISON BETWEEN NON-EQUILIBRIUM GREEN¿S FUNCTION AND MONTE CARLO SIMULATIONS FOR TRANSPORT IN A SILICON QUANTUM WIRE STRUCTURE", "INTERNATIONAL WORKSHOP ON COMPUTATIONAL ELECTRONICS (.2003.ROMA, ITALY)", 25-29, 2003
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F.J. Gamiz Perez, J.B. Roldan Aranda, A. Godoy Medina, J.E. Carceller Beltran
and
P. Cartujo-Estebanez,
"ELECTRON MOBILITY IN STRAINED-SI INVERSION LAYERS GROWN ON SIGE-ON-INSULATOR SUBSTRATES", "CONFERENCIA DE DISPOSITIVOS ELECTRÓNICOS (4.2003.CALELLA DE LA COSTA (BARCELONA))", None-None, 2003
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F.J. Gamiz Perez, J.B. Roldan Aranda
and
A. Godoy Medina,
"ELECTRON MOBILITY IN STRAINED-SI INVERSION LAYERS GROWN ON SIGE-ON-INSULATOR SUBSTRATES", "MEETING OF THE ELECTROCHEMICAL SOCIETY (203.2003.PARIS, FRANCIA)", 325-329, 2003
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F.J. Gamiz Perez, J.B. Roldan Aranda, P. Cartujo Cassinello
and
P. Cartujo-Estebanez,
"ELECTRON MOBILITY IN ULTRA-THIN SILICON-ON-INSULATOR DEVICES. A COMPARISON BETWEEN DOUBLE-GATE AND SINGLE-GATE DEVICES", "CONFERENCIA DE DISPOSITIVOS ELECTRÓNICOS (4.2003.CALELLA DE LA COSTA (BARCELONA))", None-None, 2003
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A. Godoy Medina, F.J. Gamiz Perez, J.B. Roldan Aranda, J.A. Jimenez Tejada
and
P. Cartujo-Estebanez,
"ELECTRON TRANSPORT IN SILICON QUANTUM WIRES", "CONFERENCIA DE DISPOSITIVOS ELECTRÓNICOS (4.2003.CALELLA DE LA COSTA (BARCELONA))", None-None, 2003
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F.J. Gamiz Perez, P. Cartujo Cassinello, F. Jimenez Molinos, J.E. Carceller Beltran
and
P. Cartujo Estebanez,
"IMAGE AND EXCHAGE-CORRELATION EFFECTS IN DOUBLE GATE SILICON-ON-INSULATOR TRANSISTORS", "BIANNUAL CONFERENCE ON INSULATING FILM ON SEMICONDUCTOR (13.2003.BARCELONA ESPAÑA)", 234-238, 2003
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A. Gehring-, F. Jimenez Molinos, H. Kosina-, A.J. Palma Lopez, F.J. Gamiz Perez
and
S. Selberherr-,
"MODELING OF RETENTION TIME DEGRADATION DUE INELASTIC TRAP-ASSISTED TUNNELLING IN EEPROM DEVICES", "EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES (ESREF 2003) (14) (14.2003.BURDEOS, FRANCIA)", 2003
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Última actualización del SICA: 25/03/2026
junio 2026
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