GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
(Ref. TIC-216)
14
July
2026
July 2026
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Scientific production
BACK TO LISTArticle details
| Publication | |
|---|---|
| Title: | PERFORMANCE AND RELIABILITY IN BACK-GATED CVD-GROWN MOS2 DEVICES |
| Journal title: | SOLID-STATE ELECTRONICS |
| Contribution type: | ARTICULO |
| Volume number: | 186 |
| Number of pages of the publication: | 108173 - |
| Publication year: | 2021 |
| Authors: |
FRANCISCO J GAMIZ PEREZ CARLOS MÁRQUEZ GONZÁLEZ |
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