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GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
(Ref. TIC-216)
08
October
2024
October 2024
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Scientific production

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Book chapter details

Publication
Title: SYSTEMATIC CHARACTERIZATION OF RANDOM TELEGRAPH NOISE AND ITS DEPENDENCE WITH MAGNETIC FIELDS IN MOSFET DEVICES
Book title: NOISE IN NANOSCALE SEMICONDUCTOR DEVICES
Number of pages of the publication: 135 - 174
Publisher: SPRINGER NATURE
Publication year: 2020
ISBN: 978-3-030-37499-0
Authors: FRANCISCO J GAMIZ PEREZ
CARLOS MÁRQUEZ GONZÁLEZ

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