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GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
(Ref. TIC-216)
08
October
2024
October 2024
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Scientific production

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Book chapter details

Publication
Title: IMPACT OF THE TRAP ATTRIBUTES ON THE GATE LEAKAGE MECHANISMS IN A 2D MS-EMC NANODEVICE SIMULATOR
Book title: LECTURE NOTES IN COMPUTER SCIENCE
Number of pages of the publication: 273 - 280
Publisher: SPRINGER NATURE
Publication year: 2019
ISBN: 978-3-030-10692-8
Authors: CRISTINA MEDINA BAILÓN
TOUFIK SADI
CARLOS SAMPEDRO MATARÍN
JOSÉ LUIS PADILLA DE LA TORRE
LUCA DONETTI
VIHAR GEORGIEV
FRANCISCO J GAMIZ PEREZ
ASEN ASENOV

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