@Article{ Navarro_Márquez:1084-1087,

author = { Carlos Navarro Moral and Carlos Márquez González } ,

title = { Reliability Study of Thin-Oxide Zero-Ionization Zero-Swing FET 1T-DRAM Memory Cell },

journal = { IEEE Electron Device Letters },

year = { 2019 },

volume = { 7 },

pages = { 1084-1087 },

}