@Article{ Navarro_Márquez:1084-1087,
author = { Carlos Navarro Moral and Carlos Márquez González } ,
title = { Reliability Study of Thin-Oxide Zero-Ionization Zero-Swing FET 1T-DRAM Memory Cell },
journal = { IEEE Electron Device Letters },
year = { 2019 },
volume = { 7 },
pages = { 1084-1087 },
}