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GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
(Ref. TIC-216)
14
July
2026
July 2026
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Scientific production

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Lista de artículos

Publication
C. Fernández Sánchez, N. Rodríguez Santiago, C. Márquez González, A. Ohata and F. Allibert,  "On the effective mobility extraction by point-contact techniques on silicon-on-insulator substrates", "Journal of Applied Physics" , 035707-1-035707-7, 2015
E. González Marín, I.M. Tienda-Luna, F.J. García Ruiz, J.M. González, A. Godoy Medina and F.J. Gamiz Perez,  "Analytic Potential and Charge Model of Semiconductor Quantum Wells", "IEEE Transactions on Electron Devices" , vol.62, 4186-, 2015
J.L. Padilla De La Torre, C. Medina Bailón and F.J. Gamiz Perez,  "Assessment of Pseudo-Bilayer Structures in the Heterogate Germanium Electron-Hole Bilayer Tunnel Field-Effect Transistor", "Applied Physics Letters" , vol.106, 262102-1-262102-4, 2015
J.L. Padilla De La Torre "Two Dimensional Quantum Mechanical Simulation of Low Dimensional Tunneling Devices", "Solid-State Electronics" , vol.113, 167-172, 2015
M. Cheralathan, C. Sampedro Matarín, F.J. Gamiz Perez and B. Iñiguez-Nicolau,  "Analytical temperature dependent model for nanoscale double-gate MOSFETs reproducing advanced transport models", "Solid-State Electronics" , vol.98, 2-6, 2014
J.L. Padilla De La Torre, C. Alper, F.J. Gamiz Perez and A.M. Ionescu,  "Assessment of field-induced quantum confinement in heterogate germanium electron-hole bilayer tunnel field-effect transistor", "Applied Physics Letters" , vol.105, 082108-1-082108-4, 2014
A. Mangla, J. Salesse, C. Sampedro Matarín, F.J. Gamiz Perez and C. Enz,  "Modeling the Channel Charge and Potential in Quasi-Ballistic Nanoscale Double-Gate MOSFETs", "IEEE Transactions on Electron Devices" , vol.61, 2640-2646, 2014
J.L. Padilla De La Torre, P. Padilla De La Torre, J. Valenzuela Valdés, J. Ramírez Pérez De Inestrosa and J.M. Gorriz Saez,  "RF fingerprint measurements for the identification of devices in wireless communication networks based on feature reduction and subspace transformation", "Measurement: Journal of the International Measurement Confederation" , vol.58, 468-475, 2014

SICA last updated: 25/03/2026

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