@inproceedings{ Medina_SAMPEDRO_PADILLA_Godoy_Donetti_Georgiev_GAMIZ_Asenov,

author = { Cristina Medina Bailón and CARLOS SAMPEDRO MATARÍN and JOSÉ LUIS PADILLA DE LA TORRE and Andrés Godoy Medina and Luca Donetti and Vihar Georgiev and FRANCISCO J GAMIZ PEREZ and Asen Asenov } ,

title = { Impact of Strain on S/D tunneling in FinFETs: A MS-EMC Study },

booktitle = { 23rd International Conference on Simulation of Semiconductor Processes and Devices },

year = { 2018 },

pages = { None - None },

location = { AUSTIN, EE.UU. },

}