@inproceedings{ Márquez_RODRÍGUEZ_GAMIZ_Ohata,

author = { Carlos Márquez González and NOEL RODRÍGUEZ SANTIAGO and FRANCISCO J GAMIZ PEREZ and Akiko Ohata } ,

title = { Electrical characterization of Random Telegraph Noise in back-biased Ultrathin Silicon-On-Insulator MOSFETs },

booktitle = { 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) },

year = { 2016 },

pages = { None - None },

location = { AUSTRIA, AUSTRIA, VIENA },

}