@inproceedings{ GARCÍA_González_Godoy_Tienda-Luna_Martínez_GAMIZ,

author = { FRANCISCO JAVIER GARCÍA RUIZ and Enrique González Marín and Andrés Godoy Medina and Isabel Maria Tienda-Luna and Celso Jesús Martínez Blanque and FRANCISCO J GAMIZ PEREZ } ,

title = { Back-Gate Biasing Influence on the Electron Mobility and the Threshold Voltage of Ultra Thin Box Multigate MOSFET },

booktitle = { IEEE Silicon Nanoelectronics Workshop 2013 },

year = { 2013 },

pages = { None - None },

location = { Kyoto. Japón },

}